Fcause~MORE THAN ONE WAFER LOT AT
ONE TIME~
Fcause~IMPROPER HANDLING~
Fprevention~OPERATOR TRAINING~
Fcontrol~MATERIAL VISUAL INSPECTION~
Fcontrol~VISUAL INSPECTION~
Fcontrol~SCREENING~
Feffect~ELECTRICAL FAILURE~
Feffect~VISUAL DEFECT~
CPevaluation~VISUAL INSPECTIONS~
CPevaluation~MACHINE CONTROL~
CPfrequency~1XSHIFT~
CPfrequency~2XSHIFT~
CPfrequency~CONTINUOUS~
CPmethod~VISUAL INSPECTIONS, RECORDS~
CPmethod~MACHINE CONTROL, LOGS~
CPreaction~STOP PRODUCTION PROCESS, ACTIONS PER INS303~
